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Cutting Base Plate with groove and knife edge probe

Cutting Base Plate with groove and knife edge probe

This customized cutting base plate with knife edge probe for FRTS analyzers improves productivity. Ideal for food or silicon wafer samples, it allows efficient slicing of larger samples in a single pass.

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Categories: All Products, Custom Made, Resize & Modification Tag: Resize & Modification

Description
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Description

This is a cutting base plate with a groove and knife edge probe designed for FRTS series food texture analyzers. Customized from the FR-GT and FR-NB-80 series, the extended blade and groove direction improve test efficiency and productivity for a variety of samples.

Features of Cutting Base Plate with groove and knife edge probe

Cutting base plate with slit and knife edge probe, suitable for food samples as well as silicon wafers in semiconductor testing
Vertical slit on the plate allows the tester to examine the sliced surface and continue measurement by sliding the sample horizontally, increasing testing efficiency
Knife edge probe width of 90mm, 10mm longer than the standard FR-NB-80, enabling slicing of larger samples in a single pass

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